雷射光束品質分析儀

相機式雷射光束品質分析儀

雷射光束的特性是能量非常集中,能量分佈的變化尺度往往只有1mm以內,肉眼是無法觀察出其中變化,因此如果要分析雷射空間能量的分佈狀況,必需要使用雷射光束分析儀才能明確的知道雷射能量分佈的情形,藉此也才能夠確實了解雷射的狀況是否正常。

雷射空間能量分佈一旦發生變化,雷射的聚焦能力即隨著改變,會直接影響雷射加工的品質與效率,因此雷射空間能量分析儀是調整與維護雷射設備必備的工具。

相機式的雷射光束分析儀可得到真實的2D雷射空間能量分佈的影像,適用於分析各種模態的雷射(如高斯、平頂、環形),外部同步信號可以量測低頻脈衝輸出的雷射;搭配沿著光軸移動的電控平移台,可自動量測光束品質M2,以更精確分析雷射的發散角,從而判斷雷射的聚焦能力。

使用雷射光束分析儀需要將雷射能量適當的衰減,在感測器接近飽和的狀態下量測,如果對雷射光束分析有任何疑問,歡迎與我們聯繫。
 
Item # BC106N-UV(/M) BC106N-VIS(/M)
Wavelength Range 190 - 350 nma 350 - 1100 nm
Power Range 50 fW - 1 Wb 1 fW - 1 Wc
Beam Diameter 30 µm - 6.6 mm
Compatible Light Sources CW, Pulsedd
Pulse Frequency 1 Hz - 50 kHz (Single Pulse Exposure),
Unlimited (Multi-Pulse Exposure)
Absorptive Neutral Density Filters
Nominal Values 20 dB, 30 dB, 40 dB 20 dB, 40 dB, 60 dB
(Two Sets)e
AR Coating Wavelength Range 350 - 700 nmf 350 - 700 nm (Three Filters)
650 - 1050 nm (Three Filters)
Reflective Neutral Density Filters
Nominal Values 20 dB, 30 dB, 40 dB N/A
AR Coating (Back Side of Filter) 220 to 240 nmg N/A
Sensor
Coating Lumigena None
Chip 2/3" Sony EXview HAD™ CCD
Sensor ICX285AL, Windowless
Aperture Size (Max) 8.77 mm x 6.6 mm
Pixel Size 6.45 µm x 6.45 µm
Resolution (Max) 1360 x 1024 pixels, ROI Selectable
Camera
Shutter Global
Max. Frame Rate @ Full Resolution 10 fpsh
Frame Rate @ 640 x 480 >27 fpsh
Frame Rate @ 320 x 240 >43 fpsh
Image Digitization 8 bit (0 - 255 Digits) or
12 bit (0 - 4095 Digits)
Signal-to-Noise Ratio ≥62 dB
Exposure Range 20 µs - 1 s
Gain Range 1x - 16x
Image Capture Modes Single Frame, Continuous, Hardware Triggered
Sensor Distance to Front
Filter HolderSurfacei
14.0 mm (0.55")
Interfaces
Trigger Input TTL Level , BNC Jack
Trigger Delay 42 µs - 1 s, Programmable
PC Interface High Speed USB 2.0
General
Operating Temperature 5 to 35 °C
Storage Temperature -40 to 70 °C
Physical Size (H x W x D) 80 mm x 80 mm x 36.5 mm
Including Base Plate, Filter Wheel and Filters
Weight 310 g
Mounting 1/4"-20 (M6) and 8-32 (M4) Taps on Bottom,
8-32 (M4) Tap on Side
Power Supply 2.4 W, USB Bus Powered
Safety CE Compliant
 
 
  • Design range of Lumigen coating, sensitivity is given throughout 1100 nm but shows increased non-uniformity and noise compared to uncoated BC106N-VIS. Wavelength range of supplied UV ND filters start at 220 nm.
  • @ 200 nm, depending on Beam Diameter and ND Filter.
  • @ 550 nm, depending on Beam Diameter and ND Filter.
  • Damage threshold data is currently not available for our beam profilers. For use with pulsed lasers, we recommend the following procedure as a guideline for determining a safe upper limit: Set the beam profiler to the maximum integration time (i.e., set the exposure to 1 s). Slowly increase the power until your signal reaches approximately 50% of the intensity as shown in the Profile window of the Beam software package. Multiply this power by a factor of 10. This is the safe upper limit of the mean pulse power for the beam profiler.
  • One set of filters is AR coated for the 350 nm to 700 nm range while the other is AR coated for the 650 nm to the 1050 nm range. See the ND Filters tab for more information and coating curves.
  • These filters are provided for use near the 350 nm upper wavelength range of the BC106N-UV(/M). See the ND Filters tab for more information.
  • The AR-coating on the non-reflective side of these filters provides <0.25% average reflectivity over this specified wavelength range. The filter still provides attenuation outside of this region (as shown on the ND Filters tab), but the the AR coating will not perform as well.
  • Highly dependent on PC processor and graphic adapter performance.
  • Please click here for a detailed drawing that shows the distance between the sensor position and the various edges of the beam profiler's housing.

All technical data are valid at 25 ± 5 °C and 45 ± 15% relative humidity.